This title appears in the Scientific Report :
2014
Please use the identifier:
http://dx.doi.org/10.1016/j.nima.2013.10.022 in citations.
A method for fast feature extraction in threshold scans
A method for fast feature extraction in threshold scans
We present a fast, analytical method to calculate the threshold and noise parameters from a threshold scan. This is usually done by fitting a response function to the data which is computationally very intensive. The runtime can be minimized by a hardware implementation, e.g. using an FPGA, which in...
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Personal Name(s): | Mertens, Marius C. (Corresponding Author) |
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Ritman, James | |
Contributing Institute: |
JARA-FAME; JARA-FAME Experimentelle Hadronstruktur; IKP-1 |
Published in: | Nuclear instruments & methods in physics research / A, 735 (2014) S. 615 - 619 |
Imprint: |
Amsterdam
North-Holland Publ. Co.
2014
|
DOI: |
10.1016/j.nima.2013.10.022 |
Document Type: |
Journal Article |
Research Program: |
Hadron Structure and Dynamics (HSD) |
Publikationsportal JuSER |
We present a fast, analytical method to calculate the threshold and noise parameters from a threshold scan. This is usually done by fitting a response function to the data which is computationally very intensive. The runtime can be minimized by a hardware implementation, e.g. using an FPGA, which in turn requires to minimize the mathematical complexity of the algorithm in order to fit into the available resources on the FPGA. The systematic errors of the method are analyzed and reasonable choices of the parameters for use in practice are given. |