This title appears in the Scientific Report :
2014
Please use the identifier:
http://dx.doi.org/10.1063/1.4902141 in citations.
Please use the identifier: http://hdl.handle.net/2128/16753 in citations.
Bulk sensitive hard x-ray photoemission electron microscopy
Bulk sensitive hard x-ray photoemission electron microscopy
Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a de...
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Personal Name(s): | Patt, M. (Corresponding Author) |
---|---|
Wiemann, C. / Weber, N. / Escher, M. / Gloskovskii, A. / Drube, W. / Merkel, M. / Schneider, C. M. | |
Contributing Institute: |
JARA-FIT; JARA-FIT Elektronische Eigenschaften; PGI-6 |
Published in: | Review of scientific instruments, 85 (2014) 11, S. 113704 |
Imprint: |
[S.l.]
American Institute of Physics
2014
|
DOI: |
10.1063/1.4902141 |
Document Type: |
Journal Article |
Research Program: |
Spin-based and quantum information |
Link: |
Get full text OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/16753 in citations.
Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a dedicated energy-filtered hard x-ray photoemission electron microscope (HAXPEEM) working with electron kinetic energies up to 10 keV. It is based on the NanoESCA design and also preserves the performance of the instrument in the low and medium energy range. In this way, spectromicroscopy can be performed from threshold to hard x-ray photoemission. The high potential of the HAXPEEM approach for the investigation of buried layers and structures has been shown already on a layered and structured SrTiO3 sample. Here, we present results of experiments with test structures to elaborate the imaging and spectroscopic performance of the instrument and show the capabilities of the method to image bulk properties. Additionally, we introduce a method to determine the effective attenuation length of photoelectrons in a direct photoemission experiment.© 2014 AIP Publishing LLC |