This title appears in the Scientific Report :
2011
Please use the identifier:
http://dx.doi.org/10.1016/j.tsf.2010.10.047 in citations.
Structural properties of epitaxial SrCuO(2) thin films on SrTiO(3) (001) substrates
Structural properties of epitaxial SrCuO(2) thin films on SrTiO(3) (001) substrates
Thin films of SrCuO2 with tetragonal structure have been epitaxially grown on SrTiO3 (001) substrates by high-oxygen pressure sputtering technique. The interface structure between SrCuO2 and SrTiO3 and configuration of defects in SrCuO2 thin films have been characterized by means of high-resolution...
| Personal Name(s): | Mi, SB |
|---|---|
| Contributing Institute: |
Mikrostrukturforschung; PGI-5 |
| Published in: | Thin solid films, 519 (2011) S. 2071 - 2074 |
| Imprint: |
Amsterdam [u.a.]
Elsevier
2011
|
| Physical Description: |
2071 - 2074 |
| DOI: |
10.1016/j.tsf.2010.10.047 |
| Document Type: |
Journal Article |
| Research Program: |
Grundlagen für zukünftige Informationstechnologien Erneuerbare Energien Erneuerbare Energien |
| Series Title: |
Thin Solid Films
519 |
| Subject (ZB): | |
| Publikationsportal JuSER |
|
Thin films of SrCuO2 with tetragonal structure have been epitaxially grown on SrTiO3 (001) substrates by high-oxygen pressure sputtering technique. The interface structure between SrCuO2 and SrTiO3 and configuration of defects in SrCuO2 thin films have been characterized by means of high-resolution transmission electron microscopy. Two types of film-substrate interface structure coexist and are determined as bulk-SrO-TiO2-Sr(O) -CuO2-Sr-bulk and bulk-SrO-TiO2-SrO-Sr(O) -CuO2-Sr-bulk. The planar faults with double SrO atomic layers in (100) planes in SrCuO2 thin films are observed, which mainly arise from the coalescence of these two types of film-substrate interface structure. Meanwhile, planar faults in (110) planes are observed in thin films and structural models are proposed. (C) 2010 Elsevier B.V. All rights reserved. |