This title appears in the Scientific Report :
2012
Please use the identifier:
http://hdl.handle.net/2128/7498 in citations.
Please use the identifier: http://dx.doi.org/10.1039/C2NR30413A in citations.
Nanoionic transport and electrochemical reactions in resistively switching siicon dioxide
Nanoionic transport and electrochemical reactions in resistively switching siicon dioxide
The mobility of copper ions and redox reactions of Cu at the interface with SiO(2) being directly attributed to the resistive switching effect have been studied by cyclic voltammetry (CV). The electrode kinetics of the Cu(z+)/Cu redox reactions were analyzed suggesting the formation of both Cu(+) an...
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Personal Name(s): | Tappertzhofen, S. |
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Mündelein, H. / Valov, I. / Waser, R. | |
Contributing Institute: |
Elektronische Materialien; PGI-7 JARA-FIT; JARA-FIT |
Published in: | Nanoscale, 4 (2012) S. 3040 - 3043 |
Imprint: |
Cambridge
RSC Publ.
2012
|
Physical Description: |
3040 - 3043 |
PubMed ID: |
22504836 |
DOI: |
10.1039/C2NR30413A |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Nanoscale
21 |
Subject (ZB): | |
Link: |
Get full text Published under German "Allianz" Licensing conditions on 2012-03-26. Available in OpenAccess from 2013-03-26 |
Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.1039/C2NR30413A in citations.
The mobility of copper ions and redox reactions of Cu at the interface with SiO(2) being directly attributed to the resistive switching effect have been studied by cyclic voltammetry (CV). The electrode kinetics of the Cu(z+)/Cu redox reactions were analyzed suggesting the formation of both Cu(+) and Cu(2+) species. The ion mobility shows an unexpected strong dependence on the ion concentration indicating ion-ion interactions typical for concentrated solution conditions. Based on the standard reduction potentials for Cu(z+)/Cu we identified partial electrochemical redox reactions during oxidation and reduction. The results contribute to a detailed understanding of the resistive switching effect in Cu/SiO(2)/Pt cells and provide insight into electrochemically assisted diffusion of metal cations in oxides in general. |