This title appears in the Scientific Report :
2012
Nanoscale analysis of forming and resistive switching in Fe:STO thin film devices
Nanoscale analysis of forming and resistive switching in Fe:STO thin film devices
Saved in:
Personal Name(s): | Dittmann, R. |
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Münstermann, R. / Krug, I. / Park, D. / Kronast, F. / Besmehn, A. / Mayer, J. / Schneider, C.M. / Waser, R. | |
Contributing Institute: |
JARA-FIT; JARA-FIT Zentralabteilung für Chemische Analysen; ZCH Elektronische Materialien; PGI-7 Elektronische Eigenschaften; PGI-6 |
Published in: |
Nature Conference - Frontiers in Electronic Materials |
Imprint: |
2012
|
Conference: | Aachen 2012-06-17 |
Document Type: |
Conference Presentation |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |