This title appears in the Scientific Report :
2000
Obtaining 0.1 nm interpretable resolution in electron microscopy by combining a series of images
Obtaining 0.1 nm interpretable resolution in electron microscopy by combining a series of images
Saved in:
Personal Name(s): | Thust, A. |
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Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
Fall Meeting of the Dutch and Belgien Societies for Electron Microscopy |
Imprint: |
2000
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Conference: | Papendal 2000-12-07 |
Document Type: |
Conference Presentation |
Research Program: |
Festkörperforschung für die Informationstechnik |
Publikationsportal JuSER |
Description not available. |