This title appears in the Scientific Report :
2000
Imprint in ferroelectric thin films : trapped charges model
Imprint in ferroelectric thin films : trapped charges model
Saved in:
Personal Name(s): | Grossmann, M. |
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Lohse, O. / Bolten, D. / Böttger, U. / Waser, R. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
12th IEEE International Symposium on the Applications of Ferroelectrics |
Imprint: |
2000
|
Conference: | Honolulu 2000-07-31 |
Document Type: |
Poster |
Research Program: |
Festkörperforschung für die Informationstechnik |
Publikationsportal JuSER |
Description not available. |