This title appears in the Scientific Report :
2001
Please use the identifier:
http://dx.doi.org/10.1007/s002160100873 in citations.
Trace analysis of high-purity graphite by LA-ICP-MS
Trace analysis of high-purity graphite by LA-ICP-MS
Laser-ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) has been established as a very efficient and sensitive technique for the direct analysis of solids. In this work the capability of LA-ICP-MS was investigated for determination of trace elements in high-purity graphite. Synthetic...
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Personal Name(s): | Pickhardt, C. |
---|---|
Becker, J. S. | |
Contributing Institute: |
Zentralabteilung für Chemische Analysen; ZCH |
Published in: | Fresenius' journal of analytical chemistry, 370 (2001) S. 534 - 540 |
Imprint: |
Berlin
Springer
2001
|
Physical Description: |
534 - 540 |
DOI: |
10.1007/s002160100873 |
Document Type: |
Journal Article |
Research Program: |
Entwicklung analytischer Verfahren |
Series Title: |
Fresenius Journal of Analytical Chemistry
370 |
Subject (ZB): | |
Publikationsportal JuSER |
Laser-ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) has been established as a very efficient and sensitive technique for the direct analysis of solids. In this work the capability of LA-ICP-MS was investigated for determination of trace elements in high-purity graphite. Synthetic laboratory standards with a graphite matrix were prepared for the purpose of quantifying the analytical results. Doped trace elements, concentration 0.5 mug g(-1), in a laboratory standard were determined with an accuracy of 1% to 7% and a relative standard deviation (RSD) of 2-13%. Solution-based calibration was also used for quantitative analysis of high-purity graphite. It was found that such calibration led to analytical results for trace-element determination in graphite with accuracy similar to that obtained by use of synthetic laboratory standards for quantification of analytical results. Results from quantitative determination of trace impurities in a real reactor-graphite sample, using both quantification approaches, were in good agreement. Detection limits for all elements of interest were determined in the low ng g(-1) concentration range. Improvement of detection limits by a factor of 10 was achieved for analyses of high-purity graphite with LA-ICP-MS under wet plasma conditions, because the lower background signal and increased element sensitivity. |