This title appears in the Scientific Report :
2015
Characterization of TaOx Resistive Switching Memory Devices by Scanning Tunneling Microscopy
Characterization of TaOx Resistive Switching Memory Devices by Scanning Tunneling Microscopy
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Personal Name(s): | Adepalli, K. K. (Corresponding author) |
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Moors, Marco / Lu, Q. / Wedig, Anja / Waser, R. / Tuller, H. L. / Valov, Ilia / Yildiz, B. | |
Contributing Institute: |
Elektronische Materialien; PGI-7 |
Imprint: |
2015
|
Conference: | European Materials Research Society meeting, Boston (USA), 2015-11-30 - 2015-12-04 |
Document Type: |
Conference Presentation |
Research Program: |
Controlling Electron Charge-Based Phenomena |
Publikationsportal JuSER |
Description not available. |