This title appears in the Scientific Report :
2016
Structural Study of Weak Topological Insulator Bi1Te1 Films on Si(111) grown by Molecular Beam Epitaxy
Structural Study of Weak Topological Insulator Bi1Te1 Films on Si(111) grown by Molecular Beam Epitaxy
Saved in:
Personal Name(s): | Lanius, Martin (Corresponding author) |
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Eschbach, Markus / Mlynczak, Ewa / Kellner, Jens / Gospodaric, Pika / Niu, Chengwang / Neumann, Elmar / Luysberg, Martina / Mussler, Gregor / Plucinski, Lukasz / Bihlmayer, Gustav / Blügel, Stefan / Morgenstern, Markus / Schneider, Claus Michael / Grützmacher, Detlev | |
Contributing Institute: |
Elektronische Eigenschaften; PGI-6 JARA-FIT; JARA-FIT Quanten-Theorie der Materialien; PGI-1 Quanten-Theorie der Materialien; IAS-1 PGI-8-PT; PGI-8-PT Mikrostrukturforschung; PGI-5 Halbleiter-Nanoelektronik; PGI-9 |
Imprint: |
2016
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Conference: | Frühjahrstagung der Deutschen Physikalischen Gesellschaft, Regensburg (Germany), 2016-03-06 - 2016-03-11 |
Document Type: |
Conference Presentation |
Research Program: |
Controlling Configuration-Based Phenomena Controlling Spin-Based Phenomena |
Publikationsportal JuSER |
Description not available. |