Rücker, U., & Kentzinger, E. (2001). Characterization of thin layered structures for magnetoelectronic applications.
Chicago Style CitationRücker, U., andfavorite E. Kentzinger. Characterization of Thin Layered Structures for Magnetoelectronic Applications. 2001.
MLA CitationRücker, U., andfavorite E. Kentzinger. Characterization of Thin Layered Structures for Magnetoelectronic Applications. 2001.
Warning: These citations may not always be 100% accurate.