APA Citation

Rücker, U., & Kentzinger, E. (2001). Characterization of thin layered structures for magnetoelectronic applications.

Chicago Style Citation

Rücker, U., andfavorite E. Kentzinger. Characterization of Thin Layered Structures for Magnetoelectronic Applications. 2001.

MLA Citation

Rücker, U., andfavorite E. Kentzinger. Characterization of Thin Layered Structures for Magnetoelectronic Applications. 2001.

Warning: These citations may not always be 100% accurate.