This title appears in the Scientific Report :
2000
Please use the identifier:
http://hdl.handle.net/2128/808 in citations.
Structural characterisation of oxidized allotaxially grown CoSi2 layers by X-ray scattering
Structural characterisation of oxidized allotaxially grown CoSi2 layers by X-ray scattering
Saved in:
Personal Name(s): | Kaendler, I. D. |
---|---|
Seeck, O. H. / Schlomka, J.-P. / Tolan, M. / Press, W. / Stettner, J. / Kappius, L. / Dieker, C. / Mantl, S. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Journal of applied physics, 87 (2000) S. 133 - 139 |
Imprint: |
Melville, NY
American Institute of Physics
2000
|
Physical Description: |
133 - 139 |
Document Type: |
Journal Article |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung |
Series Title: |
Journal of Applied Physics
87 |
Link: |
OpenAccess |
Publikationsportal JuSER |
Description not available. |