This title appears in the Scientific Report :
2003
Scaling effect of the dielectric constant in Ba(TixZr1-x)O3 thin films
Scaling effect of the dielectric constant in Ba(TixZr1-x)O3 thin films
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Personal Name(s): | Hofer, C. |
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Meyer, R. / Waser, R. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: |
International Conference on Electroceramics, ICE-2003 |
Imprint: |
2003
|
Conference: | Boston, Mass. 2003-08-03 |
Document Type: |
Poster |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Publikationsportal JuSER |
Description not available. |