This title appears in the Scientific Report :
2003
Investigation of the high frequency properties of BSTO thin films - a comparison of three different commonly used measurement techniques
Investigation of the high frequency properties of BSTO thin films - a comparison of three different commonly used measurement techniques
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Personal Name(s): | Tappe, S. |
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Böttger, U. / Waser, R. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: |
International Symposium on Integrated Ferroelectrics, ISIF 2003 |
Imprint: |
2003
|
Conference: | Colorado Springs 2003-03-09 |
Document Type: |
Poster |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Publikationsportal JuSER |
Description not available. |