This title appears in the Scientific Report :
2003
Influence of asymetric electrode structures including SrO and IrO on the interfacial capacitance and the failure mechanisms in PZT thin films
Influence of asymetric electrode structures including SrO and IrO on the interfacial capacitance and the failure mechanisms in PZT thin films
Saved in:
Personal Name(s): | Ellerkmann, U. |
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Schorn, P. / Bolten, D. / Böttger, U. / Waser, R. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: |
International Symposium on Integrated Ferroelectrics, ISIF 2003 |
Imprint: |
2003
|
Conference: | Colorado Springs 2003-03-09 |
Document Type: |
Conference Presentation |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Publikationsportal JuSER |
Description not available. |