This title appears in the Scientific Report :
2000
Surface structure of soft-matter thin films probes by diffuse X-ray scattering
Surface structure of soft-matter thin films probes by diffuse X-ray scattering
Saved in:
Personal Name(s): | Tolan, M. |
---|---|
Seeck, O. H. / Wang, J. / Sinha, S. K. / Rafailovich, M. H. / Sokolov, J. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
Exploration of subsurface phenomena by particle scattering / ed.: N. Q. Lam ... - IASI Press, 2000. - 0-9701790-0-6 |
Imprint: |
2000
|
ISBN: |
0-9701790-0-6 |
Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung |
Publikationsportal JuSER |
Description not available. |