This title appears in the Scientific Report :
2002
Please use the identifier:
http://hdl.handle.net/2128/1237 in citations.
The interface screening model as origin of imprint in PbZrxTi1-xO3 thin films. II. Numerical simulation and verification
The interface screening model as origin of imprint in PbZrxTi1-xO3 thin films. II. Numerical simulation and verification
Saved in:
Personal Name(s): | Grossmann, M. |
---|---|
Lohse, O. / Bolten, D. / Böttger, U. / Waser, R. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: | Journal of applied physics, 92 (2002) S. 2688 - 2696 |
Imprint: |
Melville, NY
American Institute of Physics
2002
|
Physical Description: |
2688 - 2696 |
Document Type: |
Journal Article |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Series Title: |
Journal of Applied Physics
92 |
Link: |
OpenAccess |
Publikationsportal JuSER |
Description not available. |