This title appears in the Scientific Report :
2002
Influence of electrode material on the interfacial capacitance and the failure mechanisms in PZT thin films
Influence of electrode material on the interfacial capacitance and the failure mechanisms in PZT thin films
Saved in:
Personal Name(s): | Ellerkmann, U. |
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Böttger, U. / Schneller, T. / Waser, R. / Nagel, D. R. / Bruchhaus, R. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: |
International Symposium on Integrated Ferroelectrics (ISIF) |
Imprint: |
2002
|
Conference: | Nara, Japan 2002-05-25 |
Document Type: |
Poster |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Publikationsportal JuSER |
Description not available. |