This title appears in the Scientific Report :
2003
Interface related thickness dependence of the tunability in ferroelectric perovskite thin films
Interface related thickness dependence of the tunability in ferroelectric perovskite thin films
Saved in:
Personal Name(s): | Ellerkmann, U. |
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Böttger, U. / Waser, R. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: |
3th Asian Meeting on Electroceramics (AMEC) |
Imprint: |
2003
|
Conference: | Singapore 2003-12-16 |
Document Type: |
Conference Presentation |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Publikationsportal JuSER |
Description not available. |