This title appears in the Scientific Report :
2003
Influence of asymmetric oxide electrode structures on the interface capacity and the failure mechanisms in PZT thin films
Influence of asymmetric oxide electrode structures on the interface capacity and the failure mechanisms in PZT thin films
Saved in:
Personal Name(s): | Ellerkmann, U. |
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Schorn, P. / Bolten, D. / Böttger, U. / Waser, R. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: |
International Symposium on Integrated Ferroelectrics (ISIF) |
Imprint: |
2003
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Conference: | Colorado Springs, USA 2003-03-10 |
Document Type: |
Conference Presentation |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Publikationsportal JuSER |
Description not available. |