This title appears in the Scientific Report :
2002
Simulation of steady state leakage current in thin films
Simulation of steady state leakage current in thin films
Saved in:
Personal Name(s): | Schroeder, H. |
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Schmitz, S. / Meuffels, P. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: |
Materials Research Society Fall Meeting 2002 : Symposium on Ferroelectric Thin Films XI |
Imprint: |
2002
|
Conference: | Boston, Mass. 2002-12-01 |
Document Type: |
Poster |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Publikationsportal JuSER |
Description not available. |