This title appears in the Scientific Report :
1999
Crystallization behavior of amorphous SiGe films observed by positron annihilation
Crystallization behavior of amorphous SiGe films observed by positron annihilation
Saved in:
Personal Name(s): | Edelman, F. |
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Börner, F. / Krause-Rehberg, R. / Werner, P. / Weil, R. / Beyer, W. / Butz, R. | |
Contributing Institute: |
Institut für Schicht- und Ionentechnik; ISI |
Published in: |
GaN and related alloys - 1999 : MRS Spring Meeting |
Imprint: |
1999
|
Conference: | Boston, Mass. 1999-11-28 00:00:00 |
Document Type: |
Poster |
Research Program: |
Grundlagen und Technologie von Dünnschichtsolarzellen |
Publikationsportal JuSER |
Description not available. |