This title appears in the Scientific Report :
2001
Production and scanning tunneling investigations of deposited endohedrally-doped fullerenes Ce@50, Cd@C44 and Ce@C36
Production and scanning tunneling investigations of deposited endohedrally-doped fullerenes Ce@50, Cd@C44 and Ce@C36
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Personal Name(s): | Breuer, C. |
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Blanchard, A. / Klingeler, R. / Wirth, I. / Bürgler, D. E. / Bechthold, P. S. / Neeb, A. V. / Eberhardt, W. | |
Contributing Institute: |
Elektronische Eigenschaften; IFF-IEE |
Published in: |
Cluster 2001 : 268. WE Heraeus-Seminar |
Imprint: |
2001
|
Conference: | Herzogenhorn 2001-10-07 |
Document Type: |
Poster |
Research Program: |
Elektronische Struktur von Festkörpern, Oberflächen und Schichtsystemen |
Publikationsportal JuSER |
Description not available. |