This title appears in the Scientific Report :
1999
Electronic properties of microcrystalline silicon investigated by electron spin resonance and transport measurements
Electronic properties of microcrystalline silicon investigated by electron spin resonance and transport measurements
Saved in:
Personal Name(s): | Finger, F. |
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Müller, J. / Malten, C. / Carius, R. / Wagner, H. | |
Contributing Institute: |
Institut für Schicht- und Ionentechnik; ISI |
Published in: |
Proceedings of the 18th International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology : ICAMS 18, Snowbird, 23. - 27.8.1999 / ed.: S. Wagner |
Imprint: |
1999
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Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Grundlagen und Technologie von Dünnschichtsolarzellen |
Publikationsportal JuSER |
Description not available. |