This title appears in the Scientific Report :
1999
Structural and chemical analysis of Si/SiGe heterostructures for HFET and RDT devices
Structural and chemical analysis of Si/SiGe heterostructures for HFET and RDT devices
Saved in:
Personal Name(s): | Holländer, B. |
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Contributing Institute: |
Institut für Schicht- und Ionentechnik; ISI |
Published in: |
SiQUIC Technical Meeting : Universität Duisburg |
Imprint: |
1999
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Conference: | Duisburg 1999-07-07 00:00:00 |
Document Type: |
Talk (non-conference) |
Research Program: |
Ionentechnik |
Publikationsportal JuSER |
Description not available. |