This title appears in the Scientific Report :
1999
Light induced ESR measurements on microcrystalline silicon with different crystalline volume fractions
Light induced ESR measurements on microcrystalline silicon with different crystalline volume fractions
Saved in:
Personal Name(s): | Müller, J. |
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Finger, F. / Hapke, P. / Wagner, H. | |
Contributing Institute: |
Institut für Schicht- und Ionentechnik; ISI |
Published in: |
Microcrystalline and nanocrystalline semiconductors 1998 : symposium held 30.11.-3.12.1998, Boston, Mass. / ed.: L. T. Canham. - Warrendale, PA, 1999. - (Materials Research Society Symposium proceedings ; 536). - 1-55899-442-4. - S. 299 - 304 |
Imprint: |
1999
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Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Grundlagen und Technologie von Dünnschichtsolarzellen |
Publikationsportal JuSER |
Description not available. |