This title appears in the Scientific Report :
1999
Spectroscopic ellipsometry on LT MBE GaAs
Spectroscopic ellipsometry on LT MBE GaAs
Saved in:
Personal Name(s): | Rheinländer, B. |
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Nassauer, S. / Wagner, G. / Kordos, P. | |
Contributing Institute: |
Institut für Schicht- und Ionentechnik; ISI |
Published in: |
2nd Symposium on Non-Stoichiometric III-V Compounds |
Imprint: |
1999
|
Conference: | Erlangen 1999-10-04 00:00:00 |
Document Type: |
Talk (non-conference) |
Research Program: |
Halbleiterbauelemente und Analytik |
Publikationsportal JuSER |
Description not available. |