This title appears in the Scientific Report :
1999
Nucleation and growth analysis of microcrystalline silicon by scanning probe microscopy : substrate dependence, local, structural and electronic properties of As-grown surfaces
Nucleation and growth analysis of microcrystalline silicon by scanning probe microscopy : substrate dependence, local, structural and electronic properties of As-grown surfaces
Saved in:
Personal Name(s): | Ross, C. |
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Herion, J. / Wagner, H. | |
Contributing Institute: |
Institut für Schicht- und Ionentechnik; ISI |
Published in: |
18th International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology : ICAMS 18 |
Imprint: |
1999
|
Conference: | Snowbird, Utah 1999-08-23 00:00:00 |
Document Type: |
Poster |
Research Program: |
Grundlagen und Technologie von Dünnschichtsolarzellen |
Publikationsportal JuSER |
Description not available. |