This title appears in the Scientific Report :
1999
Nucleation and growth of low-temperature fine-crystalline silicon : a scanning probe microscopy and Raman spectroscopy study of the influence of hydrogen and different substrates
Nucleation and growth of low-temperature fine-crystalline silicon : a scanning probe microscopy and Raman spectroscopy study of the influence of hydrogen and different substrates
Saved in:
Personal Name(s): | Ross, C. |
---|---|
Herion, J. / Carius, R. / Wagner, H. | |
Contributing Institute: |
Institut für Schicht- und Ionentechnik; ISI |
Published in: |
Microcrystalline and nanocrystalline semiconductors 1999 : European Materials Research Society 1999 Spring Meeting ; Symposium 1 |
Imprint: |
1999
|
Conference: | Strasbourg, France 1999-06-04 00:00:00 |
Document Type: |
Poster |
Research Program: |
Grundlagen und Technologie von Dünnschichtsolarzellen |
Publikationsportal JuSER |
Description not available. |