This title appears in the Scientific Report :
1999
Thin film electrodes for trace metal analysis by d.c., resistance changes
Thin film electrodes for trace metal analysis by d.c., resistance changes
Saved in:
Personal Name(s): | Schöning, M. J. |
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Glück, O. / Kordos, P. / Lüth, H. / Emons, H. | |
Contributing Institute: |
Institut für Schicht- und Ionentechnik; ISI |
Published in: |
2nd Conference on Chemical Microsensors and Applications : Boston, Mass., 19.-20.9.1999. - Bellingham, Wash., 1999. - (SPIE proceedings ; 3857). - S. 135 - 143 |
Imprint: |
1999
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Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
ohne FE |
Publikationsportal JuSER |
Description not available. |