This title appears in the Scientific Report : 1999 

Atomic force microscopy study of laser induced phase transitions in Ge2Sb2Te5
Weidenhof, V.
Friedrich, I. / Ziegler, S. / Wuttig, M.
Institut für Grenzflächenforschung und Vakuumphysik; IGV
Journal of applied physics, 86 (1999) S. 5879 - 5887
Melville, NY American Institute of Physics 1999
5879 - 5887
Journal Article
Grenzflächenaspekte der Informationstechnik
Journal of Applied Physics 86
OpenAccess
OpenAccess
Please use the identifier: http://hdl.handle.net/2128/17200 in citations.
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