This title appears in the Scientific Report :
1999
Please use the identifier:
http://hdl.handle.net/2128/17200 in citations.
Atomic force microscopy study of laser induced phase transitions in Ge2Sb2Te5
Atomic force microscopy study of laser induced phase transitions in Ge2Sb2Te5
Saved in:
Personal Name(s): | Weidenhof, V. |
---|---|
Friedrich, I. / Ziegler, S. / Wuttig, M. | |
Contributing Institute: |
Institut für Grenzflächenforschung und Vakuumphysik; IGV |
Published in: | Journal of applied physics, 86 (1999) S. 5879 - 5887 |
Imprint: |
Melville, NY
American Institute of Physics
1999
|
Physical Description: |
5879 - 5887 |
Document Type: |
Journal Article |
Research Program: |
Grenzflächenaspekte der Informationstechnik |
Series Title: |
Journal of Applied Physics
86 |
Link: |
OpenAccess OpenAccess |
Publikationsportal JuSER |
Description not available. |