This title appears in the Scientific Report :
2001
Application of spherical-aberration corrected transmission electron microscopy in materials science
Application of spherical-aberration corrected transmission electron microscopy in materials science
Saved in:
Personal Name(s): | Urban, K. |
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Contributing Institute: |
Mikrostrukturforschung; IFF-IMF |
Published in: |
MRS Spring Meeting |
Imprint: |
2001
|
Conference: | San Francisco, Calif. 2001-04-14 |
Document Type: |
Talk (non-conference) |
Research Program: |
Festkörperforschung für die Informationstechnik |
Publikationsportal JuSER |
Description not available. |