This title appears in the Scientific Report :
1999
Nanostructural characterization of amorphous SiGe:H alloys by anomalous small-angle X-ray scattering studies
Nanostructural characterization of amorphous SiGe:H alloys by anomalous small-angle X-ray scattering studies
Saved in:
Personal Name(s): | Goerigk, G. |
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Williamson, D. L. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
11th International Conference on Small Angle Scattering : Brookhaven National Laboratory |
Imprint: |
1999
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Conference: | Brookhaven 1999-05-17 00:00:00 |
Document Type: |
Conference Presentation |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung |
Publikationsportal JuSER |
Description not available. |