This title appears in the Scientific Report :
1999
Nanostructural characterization of a-SiGe:H alloy by anomalous small-angle X-ray scattering
Nanostructural characterization of a-SiGe:H alloy by anomalous small-angle X-ray scattering
Saved in:
Personal Name(s): | Goerigk, G. |
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Williamson, D. L. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
HASYLAB User's Meeting |
Imprint: |
1999
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Conference: | Hamburg 1999-01-29 00:00:00 |
Document Type: |
Talk (non-conference) |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung |
Publikationsportal JuSER |
Description not available. |