This title appears in the Scientific Report :
1999
Electric-field-induced changes in scanning tunneling microscopy images of metal surfaces
Electric-field-induced changes in scanning tunneling microscopy images of metal surfaces
Saved in:
Personal Name(s): | Heinze, S. |
---|---|
Nie, X. / Blügel, S. / Weinert, M. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Chemical physics letters, 315 (1999) S. 167 - 172 |
Imprint: |
Amsterdam [u.a.]
Elsevier
1999
|
Physical Description: |
167 - 172 |
Document Type: |
Journal Article |
Research Program: |
Elektronische Struktur von Festkörpern, Oberflächen und Schichtsystemen |
Series Title: |
Chemical Physics Letters
315 |
Publikationsportal JuSER |
Description not available. |