This title appears in the Scientific Report :
1999
Leakage current and resistance degradation of doped (Ba, Sr)TiO3 thin films
Leakage current and resistance degradation of doped (Ba, Sr)TiO3 thin films
Saved in:
Personal Name(s): | Hoffmann, S. |
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Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
School on Conductivity and Breakdown |
Imprint: |
1999
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Conference: | Chateaux d'Oex 1999-02-28 00:00:00 |
Document Type: |
Talk (non-conference) |
Research Program: |
Festkörperforschung für die Informationstechnik |
Publikationsportal JuSER |
Description not available. |