This title appears in the Scientific Report :
1999
Mechanisms of the formation of structural defects during low temperature growth of GaAs
Mechanisms of the formation of structural defects during low temperature growth of GaAs
Saved in:
Personal Name(s): | Luysberg, M. |
---|---|
Houben, L. / Specht, P. / Weber, E. R. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
11th Conference on Microscopy of Semiconducting Materials |
Imprint: |
1999
|
Conference: | Oxford 1999-03-22 00:00:00 |
Document Type: |
Conference Presentation |
Research Program: |
Festkörperforschung für die Informationstechnik |
Publikationsportal JuSER |
Description not available. |