This title appears in the Scientific Report :
1999
Mechanisms of the formation of structural defects during low temperature growth of GaAs
Mechanisms of the formation of structural defects during low temperature growth of GaAs
Saved in:
Personal Name(s): | Luysberg, M. |
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Houben, L. / Specht, P. / Weber, E. R. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
Proceedings of the 11th Conference on Microscopy of Semiconducting Materials, Oxford, 22. - 25.3.1999 / Royal-Microscopical Society. - London, 1999. - (Institute of Physics Conference series ; 164). - S. 279 |
Imprint: |
1999
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Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Festkörperforschung für die Informationstechnik |
Publikationsportal JuSER |
Description not available. |