This title appears in the Scientific Report :
1999
In situ study of dislocation behaviour in columnar of Al thin films on Si-substrate during thermal cycling
In situ study of dislocation behaviour in columnar of Al thin films on Si-substrate during thermal cycling
Saved in:
Personal Name(s): | Schroeder, H. |
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Allen, C. W. / Hiller, J. M. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
Thin films - stresses and mechanical properties : 8th Symposium |
Imprint: |
1999
|
Conference: | Boston, Mass. 1999-11-29 00:00:00 |
Document Type: |
Poster |
Research Program: |
Festkörperforschung für die Informationstechnik |
Publikationsportal JuSER |
Description not available. |