This title appears in the Scientific Report :
1999
Please use the identifier:
http://hdl.handle.net/2128/10812 in citations.
Imaging individual dopant atoms on cleavage surfaces of wirtzite-structure compound semiconductors
Imaging individual dopant atoms on cleavage surfaces of wirtzite-structure compound semiconductors
Saved in:
Personal Name(s): | Siemens, B. |
---|---|
Domke, G. Di. / Heinrich, M. / Ebert, P. / Urban, K. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Physical review / B, 59 (1999) S. 2995 - 2999 |
Imprint: |
College Park, Md.
APS
1999
|
Physical Description: |
2995 - 2999 |
Document Type: |
Journal Article |
Research Program: |
Erforschung neuer Materialien |
Series Title: |
Physical Review B
59 |
Link: |
OpenAccess OpenAccess |
Publikationsportal JuSER |
Description not available. |