This title appears in the Scientific Report :
2001
Strain relaxation of He+ implanated pseudomorphic Si(1-X)GeX layers on Si(100)
Strain relaxation of He+ implanated pseudomorphic Si(1-X)GeX layers on Si(100)
Saved in:
Personal Name(s): | Holländer, B. |
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Mantl, S. / Lenk, S. / Kirch, D. / Luysberg, M. / Trinkaus, H. / Herzog, H.-J. / Hackbarth, T. / Fichtner, P. F. P. | |
Contributing Institute: |
Institut für Bio- und Chemosensoren; ISG-2 Institut für Medizin; IME Mikrostrukturforschung; IFF-IMF |
Published in: |
MRS Fall Meeting |
Imprint: |
2001
|
Conference: | Boston, Mass. 2001-11-25 |
Document Type: |
Poster |
Research Program: |
Ionentechnik |
Publikationsportal JuSER |
Description not available. |