This title appears in the Scientific Report :
2009
Terahertz birefringence for orientation analysis
Terahertz birefringence for orientation analysis
A terahertz time-domain spectrometer is employed to study different birefringent samples. We develop a method based on the temporal waveform and the impulse response of a sample to map the anisotropy of their inner structure. To validate our algorithm, we study the polarization-affecting structure o...
Saved in:
Personal Name(s): | Jördens, C. |
---|---|
Scheller, M. / Wichmann, M. / Mikulics, M. / Wiesauer, K. / Koch, M. | |
Contributing Institute: |
Halbleiter-Nanoelektronik; IBN-1 JARA-FIT; JARA-FIT |
Published in: | Applied optics, 48 (2009) S. 2037 - 2044 |
Imprint: |
Washington, DC
Optical Soc. of America
2009
|
Physical Description: |
2037 - 2044 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Applied Optics
48 |
Subject (ZB): | |
Publikationsportal JuSER |
A terahertz time-domain spectrometer is employed to study different birefringent samples. We develop a method based on the temporal waveform and the impulse response of a sample to map the anisotropy of their inner structure. To validate our algorithm, we study the polarization-affecting structure of various classes of materials such as crystals, plastics, and natural products. Among all samples we observe the 14 largest birefringence for a rutile crystal with Delta n = 3.3 at 1 THz. (C) 2009 Optical Society of America |