This title appears in the Scientific Report :
2001
Please use the identifier:
http://hdl.handle.net/2128/1250 in citations.
Influence of La-doping of YBCO on transport properties of interface-engineered ramp-edge junctions
Influence of La-doping of YBCO on transport properties of interface-engineered ramp-edge junctions
Saved in:
Personal Name(s): | Heinsohn, J.-K. |
---|---|
Dittmann, R. / Rodriguez Contreras, J. / Scherbel, J. / Klushin, A. M. / Siegel, M. | |
Contributing Institute: |
Institut für Bio- und Chemosensoren; ISG-2 Elektrokeramische Materialien; IFF-EKM |
Published in: | IEEE transactions on applied superconductivity, 11 (2001) S. 795 |
Imprint: |
New York, NY
IEEE
2001
|
Physical Description: |
795 |
Document Type: |
Journal Article |
Research Program: |
Schichtsysteme und Bauelemente der Supraleiterelektronik |
Series Title: |
IEEE Transactions on Applied Superconductivity
11 |
Link: |
OpenAccess |
Publikationsportal JuSER |
Description not available. |