This title appears in the Scientific Report :
2001
Please use the identifier:
http://hdl.handle.net/2128/1251 in citations.
Please use the identifier: http://dx.doi.org/10.1063/1.1351056 in citations.
Current transport in ramp-type junctions with engineered interface
Current transport in ramp-type junctions with engineered interface
The transport properties of "interface-engineered" edge-type YBa2Cu3O7 Josephson junctions are investigated in detail. We have investigated the dependence of the current-voltage characteristics on external magnetic field, temperature, and microwave irradiation and compare them to the resis...
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Personal Name(s): | Heinsohn, J.-K. |
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Dittmann, R. / Rodriguez Contreras, J. / Scherbel, J. / Klushin, A. M. / Siegel, M. / Jia, C. L. / Golubov, A. / Kupriyanov, M. Y. | |
Contributing Institute: |
Institut für Bio- und Chemosensoren; ISG-2 Mikrostrukturforschung; IFF-IMF Elektrokeramische Materialien; IFF-EKM |
Published in: | Journal of applied physics, 89 (2001) S. 3852 |
Imprint: |
Melville, NY
American Institute of Physics
2001
|
Physical Description: |
3852 |
DOI: |
10.1063/1.1351056 |
Document Type: |
Journal Article |
Research Program: |
Schichtsysteme und Bauelemente der Supraleiterelektronik |
Series Title: |
Journal of Applied Physics
89 |
Subject (ZB): | |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.1063/1.1351056 in citations.
The transport properties of "interface-engineered" edge-type YBa2Cu3O7 Josephson junctions are investigated in detail. We have investigated the dependence of the current-voltage characteristics on external magnetic field, temperature, and microwave irradiation and compare them to the resistively shunted junction model. The temperature dependence of the critical current and the normal resistance allows us to draw conclusions to the transport of quasiparticles and Cooper pairs in the investigated "interface-engineered" junctions. We have studied the properties of junctions for which La doped YBa2Cu3O7 is used for the superconducting electrodes. We will propose a model for the undoped and the La doped case which takes into account a barrier which consists of a series connection of a normal conducting layer and an insulator, containing superconducting microconstrictions. (C) 2001 American Institute of Physics. |