This title appears in the Scientific Report :
2000
Please use the identifier:
http://hdl.handle.net/2128/822 in citations.
Capacitance and admittance spectroscopy analysis of hydrogen-degraded Pt/(Ba,Sr)TiO/Pt thin-film capacitors
Capacitance and admittance spectroscopy analysis of hydrogen-degraded Pt/(Ba,Sr)TiO/Pt thin-film capacitors
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Personal Name(s): | Liedtke, R. |
---|---|
Grossmann, M. / Waser, R. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Applied physics letters, 77 (2000) S. 2045 - 2047 |
Imprint: |
Melville, NY
American Institute of Physics
2000
|
Physical Description: |
2045 - 2047 |
Document Type: |
Journal Article |
Research Program: |
Festkörperforschung für die Informationstechnik |
Series Title: |
Applied Physics Letters
77 |
Link: |
OpenAccess |
Publikationsportal JuSER |
Description not available. |