Rath, J. K., Schropp, R. E. I., & Beyer, W. (2001). Hydrogen diffusion through deformed Si-Si bonds at grain boundaries in hot-wire CVD polycrystalline silicon films. Uetikon: Trans Tech Publ.
Chicago Style CitationRath, J. K., R. E. I. Schropp, andfavorite W. Beyer. Hydrogen Diffusion Through Deformed Si-Si Bonds At Grain Boundaries in Hot-wire CVD Polycrystalline Silicon Films. Uetikon: Trans Tech Publ, 2001.
MLA CitationRath, J. K., R. E. I. Schropp, andfavorite W. Beyer. Hydrogen Diffusion Through Deformed Si-Si Bonds At Grain Boundaries in Hot-wire CVD Polycrystalline Silicon Films. Uetikon: Trans Tech Publ, 2001.
Warning: These citations may not always be 100% accurate.