This title appears in the Scientific Report :
2004
Hole drift-mobility measurements and multiple-trapping in microcrystalline silicon
Hole drift-mobility measurements and multiple-trapping in microcrystalline silicon
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Personal Name(s): | Dylla, T. |
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Finger, F. / Schiff, E. A. | |
Contributing Institute: |
Institut für Photovoltaik; IPV |
Published in: |
Materials Research Society Spring Meeting |
Imprint: |
2004
|
Conference: | San Francisco, CA 2004-04-13 |
Document Type: |
Conference Presentation |
Research Program: |
Photovoltaik |
Publikationsportal JuSER |
Description not available. |