This title appears in the Scientific Report :
2003
Please use the identifier:
http://dx.doi.org/10.1109/LPT.2003.809264 in citations.
Please use the identifier: http://hdl.handle.net/2128/2165 in citations.
High Speed Photoconductive Switch based on Low-Temperature GaAs Transferred on Si Substrate
High Speed Photoconductive Switch based on Low-Temperature GaAs Transferred on Si Substrate
In this letter, we report high-speed photoconductive switches based on low-temperature (LT) grown GaAs on Si substrate. Epitaxially grown LT GaAs was separated from its substrate, transferred on an SiO2-coated Si substrate and integrated with a transmission line. The 10 x 20-mum(2) switches exhibit...
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Personal Name(s): | Mikulics, V. V. |
---|---|
Zheng, X. / Adam, R. / Sobolewski, R. / Kordos, P. | |
Contributing Institute: |
Institut für Grenzflächen und Vakuumtechnologien; ISG-3 |
Published in: | IEEE photonics technology letters, 15 (2003) S. 528 - 530 |
Imprint: |
New York, NY
IEEE
2003
|
Physical Description: |
528 - 530 |
DOI: |
10.1109/LPT.2003.809264 |
Document Type: |
Journal Article |
Research Program: |
Kondensierte Materie |
Series Title: |
IEEE Photonics Technology Letters
15 |
Subject (ZB): | |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/2165 in citations.
In this letter, we report high-speed photoconductive switches based on low-temperature (LT) grown GaAs on Si substrate. Epitaxially grown LT GaAs was separated from its substrate, transferred on an SiO2-coated Si substrate and integrated with a transmission line. The 10 x 20-mum(2) switches exhibit high breakdown voltage and low dark currents (<10(-7) A at 100 V). The photoresponse at 810 nm shows electrical transients with similar to0.55-ps full-width at half-maximum and similar to0.37-ps decay time, both independent on the bias voltage up to the tested limit of 120,V. The photoresponse amplitude increases up to similar to0.7 V with increased bias and the signal bandwith is similar to500 GHz. The freestanding LT GaAs switches are best suited for ultrafast optoelectronic testing since they can be placed at virtually any point on the test circuit. |