This title appears in the Scientific Report :
2005
Spherical-aberration correction and exit-plane wave function reconstruction: Synergetic tools for the atomic-scale imaging of structural imperfections semiconductor materials
Spherical-aberration correction and exit-plane wave function reconstruction: Synergetic tools for the atomic-scale imaging of structural imperfections semiconductor materials
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Personal Name(s): | Tillmann, R. G. E. |
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Thust, A. / Houben, L. / Luysberg, M. / Urban, K. | |
Contributing Institute: |
Mikrostrukturforschung; IFF-IMF |
Published in: |
XIVth International Conference on Microscopy of Semiconducting Materials |
Imprint: |
2005
|
Conference: | Oxford, United Kingdom 2005-04-11 |
Document Type: |
Conference Presentation |
Research Program: |
Kondensierte Materie |
Publikationsportal JuSER |
Description not available. |