This title appears in the Scientific Report :
2000
Electron cyclotron emission imaging diagnostic of Te profiles and fluctuations
Electron cyclotron emission imaging diagnostic of Te profiles and fluctuations
Saved in:
Personal Name(s): | Deng, B. H. |
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Contributing Institute: |
Institut für Plasmaphysik; IPP |
Published in: |
42nd Annual Meeting of the Division of Plasma Physics of the American Physical Society |
Imprint: |
2000
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Conference: | Quebec 2000-10-23 |
Document Type: |
Conference Presentation |
Research Program: |
TEC-FOM |
Publikationsportal JuSER |
Description not available. |